Kolloquiumsvortrag, Dr. Otwin Breitenstein, Max-Planck-Institut für Mikrostrukturphysik in Halle / 02.05.2016

02.05.2016 von 17:15 bis 18:45

Institut Ostufer, Kaiserstraße 2, 24143 Kiel, Raum: Geb. D, "Aquarium"

Titel: "Lock-in Thermography -- A Universal Tool for Evaluating Electronic Devices and Materials"


Lock-in Thermography (LIT) is a special variant of the well-known infrared thermography method, which uses a thermocamera detecting light in the thermal radiation range (typically 3 - 5 µm). The camera is connected to a computer, which switches certain power dissipation (heat) sources in the imaged object periodically on and off at a certain frequency. The incoming images are evaluated according to the lock-in principle, which is equivalent to connecting each image pixel to a lock-in amplifier. The primary result of a LIT measurement are the temperature modulation amplitude image and the phase image, which is a measure of the time delay of the surface temperature modulation with respect to the power modulation. Advantages of LIT compared to conventional (steady-state) thermography are a drastically improved sensitivity due to its averaging nature and a suppression of the lateral heat diffusion due to its dynamic nature.

In this talk the realization of LIT will be explained and a number of applications will be reported. Since the modulated heat sources in the investigated object can be of very different nature, LIT may be applied to study a lot of different physical problems. This talk reports on the application of LIT to non-destructive evaluation (looking below the surface of bodies), local efficiency analysis of solar cells, measurement of Peltier coefficients, failure analysis of integrated circuits, imaging of water adsorption in biological specimens, and investigation of spin-caloritronic effects in magnetic materials.

Prof. Adelung

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